IPM Positions

Resident Researcher, School of Physics (2005 - 2009 )

non IPM Affiliations

Junior Associate, Abdus Salam International Center for Theoretical Physics(Triest, Italy) - Scientific Collaboration of Institute de Min�ralogie et de Physique des Mati�res Condens�es(IMPMC), University Paris 6

Research Interests

1- Characterization of Structural and Electronic Properties by: 1) X-Ray diffraction 2)Inelastic X-ray Scattering 3) High Pressure Techniques., 2- Modeling and Simulation: 1)ab initio(DFT-LDA, GGA) Calculations 2)Compton Scattering Simulation

Research Activities

1- Compton Profile is more sensitive to the delocalized electrons which make bonding and anti-bonding between atoms. By fourier transformation from Compton Profile in special direction, we are able to determinate bonding and anti-bonding between atoms. 2- This material $(Mg_{x},Fe_{(1-x))}SiO_{3}$ has a interesting elctonic configuration (high-Spin and low-spin) under pressure. So we are interested to study electonically and structurally by DFT calculation with approach LDA + V Calculation.

Present Research Project at IPM

1- Study of Electronic Structure on $cu_{2}O$ by Compton Scattering., 2- Electronic and Structural Study on Perovsleite $(Mg_{x},Fe_{(1-x))}SiO_{3}$ Underpressure.

Related Papers

1.	M. Pashangpour, K. Imani, A.A. Sabouri-Dodaran and N. Nafari The Calculation of the Effective Interaction Parameter in LDA+U Method by Linear Response Approach for Fe(OH)2 Phys. Rev. B 80 (2009), 1-6  [abstract] arXive.org link: arXiv:0812.4116 [ abs, src, ps, others], cited by Code: IPM/P-2008/071

2.	K. Imani, F. Negari, A.A. Sabouri-Dodaran and M. Pashangpour The Effect of Atomic Displacement Defect on Electronic Transport Properties of a Carbon-Atom Chain, by Maximally Localized Wannier Functions ( In: In: The Proceedings of the 3rd Payame Noor Scientific Conference on Physics, 13-15 December, 2008, Tehran, Iran) [abstract] Code: IPM/P-2008/075

3.	K. Imani and A.A. Sabouri-Dodaran Electronic Study of the Adsorbate Molecules in Vicinity of a Graphene Sheet ( In: The Proceedings of the 3rd Payame Noor Scientific Conference on Physics, 13-15 December, 2008, Khuzestan, Iran) [abstract] Code: IPM/P-2008/074

4.	M. Pashangpour and A.A. Sabouri-Dodaran The Calculation of the Effective Interaction Parameter by Linear Response Approach for (FexMg1-x)(OH)2 ( In: The Proceedings of the 3rd Payame Noor Scientific Conference on Physics, 13-15 December, 2008, Tehran, Iran) [abstract] Code: IPM/P-2008/073

5.	M. Pashangpour, K. Imani and A.A. Sabouri-Dodaran Calculation of Effective Interaction Parameter by Linear Response Approach for Fe(OH)2 ( In: The Proceedings of 14th IASBS Physics Conference on Condensed Matter Physics, 22-23 may, 2008, p150-153, Zanjan, Iran) [abstract] Code: IPM/P-2008/072

6.	D. Ahmady, A.A. Sabouri dodran, M. Farjam and A. Babazadeh Numerical Solution of the Thomas- Fermi Equation for Half- Space Jellium and Quarterspace Ellium Metal Edges ( In: The Proceedings of The 8th National Condensed Matter Physics, 2006, p351-3556, Mashad, Iran) [abstract] Code: IPM/P-2006/084

7.	A.A. Sabouri-Dodaran, Ch. Bellin, A. Haji Malek, N. Naghdiani and G. Loupias Electronic Structure and Bonding Properties in Cu2O ( In: The Proceedings of The 8th National Condensed Matter Physics, 2006, p373-376, Mashad,Iran) [abstract] Code: IPM/P-2006/083

8.	A.A. Sabouri-Dodaran, Ch. Bellin, M. Marangolo, F. Mauri, G. Fiquet, G. Loupias, M. Mezouar, Th. Buslaps, C. H�rold, F. Rachdi and S. Rabii Study of Insulator to Metal Transition in Rb4C60 by Coherent and Incoherent X-ray Scattering under Pressure J. Phs. Chem. of Solid 67 (2006), 1132-1136  [abstract] Code: IPM/P-2006/057

9.	R. Asgari, A. L. Subaşi, A. A. Sabouri-Dodaran and B. Tanatar Static Local-Field Factors in A Two-Dimensional Electron Liquid Phys. Rev. B 74 (2006), 155319  [abstract] Code: IPM/P-2006/006

10.	A.A. Sabouri-Dodaran, Ch . Bellin , G. Loupias, M. Marangolo, S. Rabii, F. Rachdi, Th. Buslaps and M. Mezouar In Situ Pressure Study of Rb4C60 Insulator to Metal Phys. Rev. B 72 (2005), 085412  [abstract] Code: IPM/P-2005/098