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Paper   IPM / Particles / 15787
School of Particles and Accelerator
  Title:   Plasma Platform to Investigate Error Structure in the Electronic Components
1.  Mahmud Vahdat Roshan
2.  Hossein Sadeghi
3.  S Fazelpour
4.  Sing Lee
5.  Seongling Yap
  Status:   Published
  Journal: IEEE Transactions on Plasma Science
  No.:  5
  Vol.:  47
  Year:  2019
  Supported by:  IPM
This program was designed to introduce a plasma platform to examine the field programmable gate array (FPGA) of the link boards typically used at the CERNs Large Hadron Collider (LHC). Pulsed plasma systems with accelerating gradient of 1 kV/um generate high-intensity, high-energy radiation beams. Single-event upset (SEU) is caused by radiation deposition in the FPGA. In FPGA, the SEU probability for 1-MeV protons and 10-keV X-rays are 0.1 and 2*10 -9 particle -1 . The number of SEU induced in the Si by 1-MeV proton irradiation at 0.8-V bias computed from simulation in COMSOL Multiphysics was 1.8 * 10 5 . Although more experimental research is needed to identify the underlying mechanisms, pulsed plasma is perceived as being a smart alternative to investigate the error structure in FPGA.

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