In this paper, we study many geometrical properties of contour loops to characterize the morphology of synthetic multifractal rough surfaces, which are generated by multiplicative hierarchical cascading processes. To this end, two different classes of multifractal rough surfaces are numerically simulated. As the first group, singular measure multifractal rough surfaces are generated by using the p model. The smoothened multifractal rough surface then is simulated by convolving the first group with a socalled Hurst exponent, H^{*} . The generalized multifractal dimension of isoheight lines (contours), D(q), correlation exponent of contours, x_{l}, cumulative distributions of areas, ξ, and perimeters, η, are calculated for both synthetic multifractal rough surfaces. Our results show that for both mentioned classes, hyperscaling relations for contour loops are the same as that of monofractal systems. In contrast to singular measure multifractal rough surfaces, H^{*} plays a leading role in smoothened multifractal rough surfaces. All computed geometrical exponents for the first class depend not only on its Hurst exponent but also on the set of p values. But in spite of multifractal nature of smoothened surfaces (second class), the corresponding geometrical exponents are controlled by H^{*}, the same as what happens for monofractal rough surfaces
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