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Paper   IPM / P / 14145
School of Physics
  Title:   Comment on: [Comment on: Characterization of Microroughness Parameters in Titanium Nitride Thin Films Grown by DC Magnetron Sputtering
  Author(s): 
1.  A. Gelali
2.  A. Shafiekhani
3.  A. Ghorbani
4.  A. Ahmadpourian
  Status:   Published
  Journal: J. Fusion Energy
  Vol.:  31
  Year:  2012
  Pages:   592
  Supported by:  IPM
  Abstract:
Firstly, I appreciate authors of published comment, Solaymani et al. [1], for their attention to our paper. I would like to attract your attention to few points to determine the raised points. Existent mistakes in AFM Images Analysis section (lines 3 and 5) are only typos and should be correct to Rrms and . In page 3 (line 5), DL = N/L is correct. Please see [2] and [3]. In the Eq. 5, Df=8-2. Please see [2, 4, 5]. Since 2D and 3D AFM images in [6] present the better angle of view, I suggest the authors of comment pay more attention to them. I think, they describe the process of fabrication of particles clearly. It is clear that, some typos cannot depreciate the value of paper.

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